Title :
A model for bit error rate degradation during media thermal decay
Author :
Jin, Zhen ; Ide, Hiroshi ; Zhou, Hong ; Luo, Peng ; Bertram, Neal
Author_Institution :
Center for Magnetic Recording Res., California Univ., San Diego, La Jolla, CA, USA
fDate :
7/1/2001 12:00:00 AM
Abstract :
A model is presented which relates medium grain size to the system BER degradation caused by media thermal decay. A simple model is used to calculate the magnetization and playback signal decay specifically focusing on grain size distributions. These results are utilized to determine signal to noise ratio (SNR) and bit error rate (BER) over a 10-year period for a recording density near 50 Gbit/in2. In our calculation, both DC and transition noise are included. Typically, the DC noise increases more rapidly with storage time than the transition noise decreases. Because of the trade off between DC and transition noise, the relation between BER and SNR is complicated
Keywords :
grain size; magnetic recording noise; magnetisation; DC noise; bit error rate; grain size distribution; magnetic recording medium; magnetization; playback signal; signal-to-noise ratio; storage time; thermal decay; transition noise; Acoustical engineering; Anisotropic magnetoresistance; Bit error rate; Energy barrier; Grain size; Magnetic noise; Magnetic recording; Magnetization; Signal to noise ratio; Thermal degradation;
Journal_Title :
Magnetics, IEEE Transactions on
