DocumentCode :
1530027
Title :
Scatter diagram analysis of Cr segregation in Co-Cr based recording media
Author :
Grogger, Werner ; Krishnan, Kannan M.
Author_Institution :
Div. of Mater. Sci., Lawrence Berkeley Nat. Lab., CA, USA
Volume :
37
Issue :
4
fYear :
2001
fDate :
7/1/2001 12:00:00 AM
Firstpage :
1465
Lastpage :
1467
Abstract :
The segregation of Cr in Co-Cr based thin film recording media was measured using energy-filtered TEM images and quantitatively evaluated by the scatter diagram (SD) method. Following a description of such SD analysis it is applied to the measurement of Cr segregation in two CoCrPtB thin film recording media with different Cr contents. Taking the entire data sets into account, the two dimensional distribution of the nonmagnetic, high Cr phase can be visualized and determined quantitatively. Cr segregates to the intergranular regions and the sample with the higher Cr content shows a significantly higher and more uniform distribution of the nonmagnetic phase at the boundaries. This leads to better magnetic isolation between the grains and correlates with the better recording performance observed in the same sample
Keywords :
boron alloys; chromium alloys; cobalt alloys; ferromagnetic materials; grain boundary segregation; magnetic recording; magnetic thin films; platinum alloys; transmission electron microscopy; 2D histograms; CoCrPtB; chromium segregation; energy-filtered TEM images; intergranular regions; magnetic isolation between grains; nonmagnetic phase; recording performance; scatter diagram analysis; thin film recording media; two dimensional distribution; Chromium alloys; Electron microscopy; Energy measurement; Grain boundaries; Laboratories; Magnetic recording; Spectroscopy; Transistors; Transmission electron microscopy; X-ray scattering;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.950872
Filename :
950872
Link To Document :
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