Controlling the preferred orientation in granular CoCrPt:C thin films for high-areal density magnetic recording

Author

Xu, Yingfan ; Wang, J.P. ; Pock, C.K. ; Cheng, Xiaomin ; Shan, Z.S. ; Chong, T.C.

Author_Institution

Data Storage Inst., Singapore

Volume

37

Issue

4

fYear

2001

fDate

7/1/2001 12:00:00 AM

Firstpage

1491

Lastpage

1493

Abstract

Magnetic and structural properties of hcp-(CoCrPt):C granular thin films for potential applications in high areal density recording media have been investigated. CrX (X=I, Ru, Mn) underlayers with and without NiAl seedlayer has been applied to improve the in-plane preferred orientation of the Co alloy grains. The addition of Ru or Mn to the Cr underlayer promotes Co (11.0) in-plane orientation; using a NiAl seedlayer promotes Co (10.0). For films with CrMn underlayer and NiAl seedlayer, H_c reaches 3360 Oe and M_rt decreases to 0.33 memu/cm². Thermal stability and reversal properties have been studied by moment-decay measurements. These granular films possess good in-plane preferred orientation of the magnetic moment and c-axis, which is desirable for high areal density longitudinal recording

Keywords

chromium alloys; chromium compounds; cobalt alloys; crystal microstructure; ferromagnetic materials; granular materials; magnetic moments; magnetic recording; magnetic thin films; magnetisation reversal; manganese alloys; platinum alloys; ruthenium alloys; thermal stability; Co alloy grains; CoCrPt:C; CrI; CrMn; CrRu; H_c; NiAl; NiAl seedlayer; c-axis; granular CoCrPt:C thin films; hcp-(CoCrPt):C granular thin films; high-areal density magnetic recording; in-plane preferred orientation; magnetic moment; magnetic properties; moment-decay measurements; preferred orientation; reversal properties; structural properties; thermal stability; Chromium; Cobalt alloys; Glass; Grain boundaries; Magnetic films; Magnetic recording; Manganese alloys; Sputtering; Transistors; X-ray scattering;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.950880

Filename

950880