Magnetic field and thermal reversal properties of exchange-bias recording films

Author

Shan, Z.S. ; Jin, D. ; Ren, H.B. ; Wang, J.P. ; Piramanayagam, S.N. ; Pang, S.I. ; Chong, T.C.

Author_Institution

Data Storage Inst., Singapore

Volume

37

Issue

4

fYear

2001

fDate

7/1/2001 12:00:00 AM

Firstpage

1500

Lastpage

1503

Abstract

Effect of exchange-bias coupling between ferromagnetic (FM) layer and antiferromagnetic (AFM) underlayer on the H-field and thermal reversal properties was studied analytically by minimizing the free energy E(α,β) of the bilayer system. Correlation between the effective-thermal-stability-factor (K_uV*/k_BT)_eff, coercivity H_C, and parameters of the bilayer system is presented. Emphasis is on analyzing the energy-barrier E_B influence upon the moment reversal properties

Keywords

coercive force; exchange interactions (electron); free energy; interface magnetism; magnetic recording; magnetic switching; magnetic thin films; magnetisation reversal; thermal stability; antiferromagnetic underlayer; bilayer system; coercivity; effective-thermal-stability-factor; energy-barrier influence; exchange-bias coupling effect; exchange-bias recording films; ferromagnetic layer; free energy; magnetic field properties; moment reversal properties; thermal activation; thermal reversal properties; Anisotropic magnetoresistance; Antiferromagnetic materials; Coercive force; Couplings; Magnetic fields; Magnetic films; Magnetic properties; Magnetic recording; Magnetization; Thermal stability;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.950883

Filename

950883