A study on VMn underlayer in CoCrPt longitudinal media

Author

Oh, Se Chung ; Lee, Taek Dong

Author_Institution

Dept. of Mater. Sci. & Eng., Korea Adv. Inst. of Sci. & Technol., Taejon, South Korea

Volume

37

Issue

4

fYear

2001

fDate

7/1/2001 12:00:00 AM

Firstpage

1504

Lastpage

1507

Abstract

The effects of a novel VMn underlayer on magnetic properties of a CoCrPt/VMn longitudinal medium were studied and compared with those of a CoCrPt/Cr medium. It was found that the VMn film had (200) preferred orientation and the lattice constant was about 0.2967 nm, which is slightly larger than that of the Cr, 0.2888 nm. The grain size of the VMn film was 9.8 nm at 30 nm thickness and this is about 39% smaller than that of a similarly deposited Cr film. The CoCrP/VMn films showed higher coercivity in comparison with the CoCrPt/Cr films. V and Mn have diffused into the CoCrPt magnetic layer more uniformly rather than preferentially along grain boundaries and this reduced Ms at higher substrate temperature. However, due to the grain substrate of the CoCrPt on the VMn underlayer, we have introduced a CrMo intermediate layer and its magnetic properties are described

Keywords

X-ray chemical analysis; X-ray diffraction; chromium alloys; cobalt alloys; coercive force; diffusion; grain boundaries; grain size; interface magnetism; magnetic recording; magnetic thin films; manganese alloys; platinum alloys; sputtered coatings; texture; transmission electron microscopy; vanadium alloys; CoCrPt-CrMo-VMn; CoCrPt-VMn; EDX; TEM; XRD; grain size; intermediate layer; lattice constant; longitudinal recording media; magnetic properties; preferred orientation; sputtered films; underlayer effect; Chromium; Coercive force; Grain size; Lattices; Magnetic films; Magnetic noise; Magnetic properties; Magnetic recording; Substrates; Temperature;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.950884

Filename

950884