Title :
A 9-bit 80 MS/s Successive Approximation Register Analog-to-Digital Converter With a Capacitor Reduction Technique
Author :
Cho, Young-Kyun ; Jeon, Young-Deuk ; Nam, Jae-Won ; Kwon, Jong-Kee
Author_Institution :
Convergence Components & Mater. Res. Lab., Electron. & Telecommun. Res. Inst., Daejeon, South Korea
fDate :
7/1/2010 12:00:00 AM
Abstract :
A 9-bit 80 MS/s successive approximation register analog-to-digital converter (ADC), which is suitable for low power and a small area, is presented. The 9-bit capacitor array consists of only 16 unit capacitors and a coupling capacitor due to the proposed binary-weighted split-capacitor arrays with a merged-capacitor switching technique. The proposed ADC includes a comparator with offset cancellation and uses digital calibration for error correction. The ADC is implemented in a 65-nm complimentary metal-oxide-semiconductor technology and occupies an active area of 0.068 mm2 with a reference buffer. The differential and integral nonlinearities of the ADC are less than 0.37 and 0.40 LSB, respectively. The ADC shows a signal-to-noise-distortion ratio of 50.71 dB, a spurious-free dynamic range of 66.72 dB, and an effective number of bits of 8.13 bits with a 78 MHz sinusoidal input at 80 MS/s. The ADC consumes 3.4 mW with the reference buffer at a 1.0-V supply and achieves a figure of merit of 78 fJ/conversion step.
Keywords :
CMOS digital integrated circuits; analogue-digital conversion; capacitors; error correction; 9-bit capacitor array; binary-weighted split-capacitor arrays; capacitor reduction technique; comparator; complimentary metal-oxide-semiconductor technology; coupling capacitor; differential nonlinearity; digital calibration; error correction; frequency 78 MHz; integral nonlinearity; merged-capacitor switching technique; offset cancellation; power 3.4 mW; reference buffer; signal-to-noise-distortion ratio; size 65 nm; successive approximation register analog-to-digital converter; voltage 1 V; Error correction; merged-capacitor switching (MCS); offset cancellation; split-capacitor array; successive approximation register (SAR) analog-to-digital converter (ADC);
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
DOI :
10.1109/TCSII.2010.2048387