DocumentCode :
1530383
Title :
Patterning of granular magnetic media with a focused ion beam to produce single-domain islands at >140 Gbit/in2
Author :
Rettner, Charles T. ; Best, Margaret E. ; Terris, Bruce D.
Author_Institution :
IBM Almaden Res. Center, San Jose, CA, USA
Volume :
37
Issue :
4
fYear :
2001
fDate :
7/1/2001 12:00:00 AM
Firstpage :
1649
Lastpage :
1651
Abstract :
We have used a focused ion beam to directly pattern thin-film granular perpendicular Co70Cr18Pt12 media. By cutting trenches ~6 nm deep in the ~20 nm media, we have produced square arrays of magnetically isolated islands with periods in the range 65-500 nm. At periods below ~130 nm we observe only single magnetic domains, which exhibit a rough “checker-board” pattern upon ac demagnetization. We have patterned at densities of over 140 Gbit/in2
Keywords :
chromium alloys; cobalt alloys; demagnetisation; ferromagnetic materials; focused ion beam technology; granular materials; magnetic domains; magnetic thin films; perpendicular magnetic recording; platinum alloys; 20 to 130 nm; 6 nm; Co70Cr18Pt12; ac demagnetization; checker-board pattern; focused ion beam; granular magnetic media; magnetically isolated islands; perpendicular Co70Cr18Pt12 media; recording densities; single-domain islands; square arrays; Atomic force microscopy; Chromium; Ion beams; Magnetic anisotropy; Magnetic domains; Magnetic films; Magnetic force microscopy; Perpendicular magnetic anisotropy; Perpendicular magnetic recording; Scanning electron microscopy;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.950927
Filename :
950927
Link To Document :
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