DocumentCode :
1530521
Title :
Extraction of Intrinsic and Extrinsic Parameters in Electroabsorption Modulators
Author :
Yañez, Mauricio ; Cartledge, John C.
Author_Institution :
Dept. of Electr. & Comput. Eng., Queen´´s Univ., Kingston, ON, Canada
Volume :
58
Issue :
8
fYear :
2010
Firstpage :
2284
Lastpage :
2291
Abstract :
A new method is presented for extracting the intrinsic and extrinsic parameters of electroabsorption modulators (EAMs) from measurements of their electrical to optical and optical to electrical responses over frequency. The method is analytically described and experimentally verified with the use of an electrical vector network analyzer. It is shown that the use of EAMs as both modulators and receivers allows the extraction of the parameters, which govern their intrinsic frequency response while removing the effect of the interconnect/package used and the need for an accurately calibrated optical modulator and receiver pair used to do the measurements. A set of S-parameters accounting for the effect of the interconnect/package is also calculated and used along with the intrinsic parameters to reproduce the measured frequency response of the EAM. Good agreement is obtained between calculated and measured results, thus confirming the validity of the proposed technique.
Keywords :
calibration; electro-optical modulation; electroabsorption; integrated circuit interconnections; integrated circuit packaging; modulators; EAM; Sι-parameters accounting; calibrated optical modulator; electrical responses measurements; electrical vector network analyzer; electroabsorption modulators; extrinsic parameters extraction; integrated circuit interconnects; integrated circuit packaging; intrinsic frequency response; intrinsic parameters extraction; optical responses measurements; receivers; Frequency measurement; Frequency response; High speed optical techniques; Nonlinear optics; Optical interconnections; Optical modulation; Optical receivers; Optical scattering; Packaging; Voltage; Electroabsorption modulator (EAM); frequency response; parameter extraction;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2010.2052868
Filename :
5504880
Link To Document :
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