• DocumentCode
    1530632
  • Title

    Feasibility of ultra-dense spin-tunneling random access memory

  • Author

    Wang, Zhi G. ; Mapps, Desmond J. ; He, Lian N. ; Clegg, Warwick W ; Wilton, David T. ; Robinson, P. ; Nakamur, Yoshihisa

  • Author_Institution
    Centre for Res. in Inf. Storage Technol., Plymouth Univ., UK
  • Volume
    33
  • Issue
    6
  • fYear
    1997
  • fDate
    11/1/1997 12:00:00 AM
  • Firstpage
    4498
  • Lastpage
    4512
  • Abstract
    Three-dimensional (3-D) finite element models have been utilized to simulate electromagnetic behaviors in spin-tunneling random access memory (STram). The most significant contributors have been identified. Compared with conventional current-in-plane (CIP) giant magneto-resistive (GMR) memory, whose signal level is inversely proportional to the square root of the storage density, these current-perpendicular-to-plane (CPP) STram elements provide an excellent readout property in that their signal level is independent of their cross-section area. This result is so attractive that the density of STram should not be limited by signal degradation. Moreover, a magnetic flux closure design was found to reduce the crossfeed by about a factor of five, compared with conventional keeperless design, which is the most favored approach for achieving 109 bits/cm2 areal density. Although the storage mechanism described in this paper is made of STram, the flux-closure design could be generally applicable to other magnetic solid state memories
  • Keywords
    finite element analysis; giant magnetoresistance; magnetic storage; magnetoresistive devices; random-access storage; tunnelling; areal density; crossfeed; current-perpendicular-to-plane STram; electromagnetic simulation; giant magnetoresistance; magnetic flux closure design; magnetic solid state memory; readout; spin-tunneling random access memory; storage; three-dimensional finite element model; Giant magnetoresistance; Helium; Magnetic flux; Magnetic properties; Radio frequency; Random access memory; Resists; Solid state circuits; Sputtering; Surface contamination;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.649888
  • Filename
    649888