• DocumentCode
    1530644
  • Title

    A 780 nm high-power and highly reliable laser diode with a long cavity and a thin tapered-thickness active layer

  • Author

    Shima, Akihiro ; Matsubara, Hiroshi ; Susaki, Wataru

  • Author_Institution
    Mitsubishi Electric Corp., Hyogo, Japan
  • Volume
    26
  • Issue
    11
  • fYear
    1990
  • fDate
    11/1/1990 12:00:00 AM
  • Firstpage
    1864
  • Lastpage
    1872
  • Abstract
    Conventional AlGaAs laser diodes with uniform thickness active layers of various cavity lengths are investigated. It is recognized that the extension of the cavity length is effective in the improvement of the maximum output power, the temperature characteristics, and the operating life in high-temperature conditions. A 780-nm, high-power laser diode having a 350-μm-long cavity with a thin tapered-thickness active layer was fabricated. The optical power density near the mirror facets, the thermal resistance, the current density, and the carrier density were reduced by this structure. The laser emitted over 100 mW of CW (continuous-wave) output power at temperatures up to 80°C. A maximum output power level of 160 mW was achieved at room temperature. The fundamental transverse mode was confirmed at least up to 120 mW
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; laser cavity resonators; laser transitions; semiconductor junction lasers; 100 mW; 160 mW; 20 to 80 degC; 350 micron; 780 nm; AlGaAs laser diodes; III-V semiconductor; carrier density; continuous wave output power; current density; fundamental transverse mode; high-power laser diode; long cavity; maximum output power; mirror facets; operating life; optical power density; temperature characteristics; thermal resistance; thin tapered-thickness active layer; Character recognition; Charge carrier density; Current density; Diode lasers; Laser modes; Mirrors; Power generation; Stimulated emission; Temperature; Thermal resistance;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.62105
  • Filename
    62105