DocumentCode :
1530728
Title :
Roughness of thin perfluoropolyether lubricant films: influence on disk drive technology
Author :
Mate, C. Mathew ; Toney, Michael F. ; Leach, K.Amanda
Author_Institution :
IBM Almaden Res. Center, San Jose, CA, USA
Volume :
37
Issue :
4
fYear :
2001
fDate :
7/1/2001 12:00:00 AM
Firstpage :
1821
Lastpage :
1823
Abstract :
In disk drive technology, lubricant thickness and roughness are important, but often overlooked, contributors to slider-disk spacing. In this paper, we use X-ray reflectivity to measure the thickness and lubricant-air roughness of a perfluoropolyether lubricant (Fomblin Zdol) on silicon wafers and carbon overcoats. For Zdol on smooth silicon, the roughness increases with increasing lubricant thickness consistent with capillary wave roughening. For Zdol on the rougher surface of amorphous hydrogenated carbon, the lubricant smoothes to a value limited by the capillary wave roughening. We show that the lubricant density above the surface does not reach the density of air until approximately 3σ away from the average lubricant thickness. This lubricant-air interface width contributes substantially to current and future slider-disk spacings
Keywords :
X-ray reflection; capillary waves; disc drives; interface roughness; lubrication; polymer films; C; Fomblin Zdol; Si; X-ray reflectivity; amorphous hydrogenated carbon overcoat; capillary wave roughening; disk drive technology; head-disk interface; lubricant density; lubricant roughness; lubricant thickness; lubricant-air interface; magnetic recording; perfluoropolyether thin film; silicon wafer; slider-disk spacing; Amorphous materials; Disk drives; Lubricants; Optical films; Reflectivity; Rough surfaces; Silicon; Surface roughness; Surface waves; Thickness measurement;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.950978
Filename :
950978
Link To Document :
بازگشت