DocumentCode
1530815
Title
An experimental and theoretical investigation of disk damage caused by head-disk impact in loading process
Author
Sheng, Gang ; Zhang, Jun
Author_Institution
Singapore Res. Lab., Singapore
Volume
37
Issue
4
fYear
2001
fDate
7/1/2001 12:00:00 AM
Firstpage
1863
Lastpage
1865
Abstract
This paper presents an experimental and analytical study of disk damage caused by head-disk impact in loading process. The electric resistance and AE measurements are used to monitor the head-disk contact. The long term ramp loading tests are conducted on a commercial tester. The disk damage are checked by using the tester, the optical microscopy, the AFM and the scanning reflectance analyzer. It was found that after many numbers of loading and unloading operations, the head-disk impact occurs due to the degradation of slider flying ability. However, even with a quite number of repeat head-disk impact, the tested disks does not exhibit noticeable wear and damage unless the impact number surpass some value. It demonstrated that the disk wear under the repeat impact is not progressive. A model is proposed to elucidate this phenomena. It shows that the wear exhibits the fatigue wear. The analytical results are correlated with the experiments and the previously published results
Keywords
magnetic disc storage; magnetic heads; acoustic emission; atomic force microscopy; disk damage; dynamic load/unload technology; electric resistance; fatigue wear; head-disk impact; loading process; optical microscopy; scanning reflectance analyzer; slider flying height; tester instrumentation; tribology; wear; Atomic force microscopy; Degradation; Electric resistance; Electric variables measurement; Electrical resistance measurement; Fatigue; Monitoring; Optical microscopy; Reflectivity; Testing;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.950991
Filename
950991
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