DocumentCode :
1530815
Title :
An experimental and theoretical investigation of disk damage caused by head-disk impact in loading process
Author :
Sheng, Gang ; Zhang, Jun
Author_Institution :
Singapore Res. Lab., Singapore
Volume :
37
Issue :
4
fYear :
2001
fDate :
7/1/2001 12:00:00 AM
Firstpage :
1863
Lastpage :
1865
Abstract :
This paper presents an experimental and analytical study of disk damage caused by head-disk impact in loading process. The electric resistance and AE measurements are used to monitor the head-disk contact. The long term ramp loading tests are conducted on a commercial tester. The disk damage are checked by using the tester, the optical microscopy, the AFM and the scanning reflectance analyzer. It was found that after many numbers of loading and unloading operations, the head-disk impact occurs due to the degradation of slider flying ability. However, even with a quite number of repeat head-disk impact, the tested disks does not exhibit noticeable wear and damage unless the impact number surpass some value. It demonstrated that the disk wear under the repeat impact is not progressive. A model is proposed to elucidate this phenomena. It shows that the wear exhibits the fatigue wear. The analytical results are correlated with the experiments and the previously published results
Keywords :
magnetic disc storage; magnetic heads; acoustic emission; atomic force microscopy; disk damage; dynamic load/unload technology; electric resistance; fatigue wear; head-disk impact; loading process; optical microscopy; scanning reflectance analyzer; slider flying height; tester instrumentation; tribology; wear; Atomic force microscopy; Degradation; Electric resistance; Electric variables measurement; Electrical resistance measurement; Fatigue; Monitoring; Optical microscopy; Reflectivity; Testing;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.950991
Filename :
950991
Link To Document :
بازگشت