• DocumentCode
    1530815
  • Title

    An experimental and theoretical investigation of disk damage caused by head-disk impact in loading process

  • Author

    Sheng, Gang ; Zhang, Jun

  • Author_Institution
    Singapore Res. Lab., Singapore
  • Volume
    37
  • Issue
    4
  • fYear
    2001
  • fDate
    7/1/2001 12:00:00 AM
  • Firstpage
    1863
  • Lastpage
    1865
  • Abstract
    This paper presents an experimental and analytical study of disk damage caused by head-disk impact in loading process. The electric resistance and AE measurements are used to monitor the head-disk contact. The long term ramp loading tests are conducted on a commercial tester. The disk damage are checked by using the tester, the optical microscopy, the AFM and the scanning reflectance analyzer. It was found that after many numbers of loading and unloading operations, the head-disk impact occurs due to the degradation of slider flying ability. However, even with a quite number of repeat head-disk impact, the tested disks does not exhibit noticeable wear and damage unless the impact number surpass some value. It demonstrated that the disk wear under the repeat impact is not progressive. A model is proposed to elucidate this phenomena. It shows that the wear exhibits the fatigue wear. The analytical results are correlated with the experiments and the previously published results
  • Keywords
    magnetic disc storage; magnetic heads; acoustic emission; atomic force microscopy; disk damage; dynamic load/unload technology; electric resistance; fatigue wear; head-disk impact; loading process; optical microscopy; scanning reflectance analyzer; slider flying height; tester instrumentation; tribology; wear; Atomic force microscopy; Degradation; Electric resistance; Electric variables measurement; Electrical resistance measurement; Fatigue; Monitoring; Optical microscopy; Reflectivity; Testing;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.950991
  • Filename
    950991