DocumentCode
1530965
Title
Normal incidence polarization interferometry flying height testing
Author
Clegg, Warwick ; Liu, Xinqun ; Liu, Bo ; Li, Amei ; Chong, Chongtow ; Jenkins, David
Author_Institution
Centre for Res. in Inf. Storage Technol., Plymouth Univ., UK
Volume
37
Issue
4
fYear
2001
fDate
7/1/2001 12:00:00 AM
Firstpage
1941
Lastpage
1943
Abstract
In this paper, a dual-beam normal incidence polarization interferometer is presented to measure the flying height or head-disk spacing. It has the advantages of both the intensity interferometry method and the oblique incidence polarization interferometry method. With this polarization interferometer, not only can the flying height be measured down to contact without losing accuracy, but also the pitch and roll of the head-slider can be detected dynamically. The optical parameters of the head-slider can also be determined. Design details and experimental results are given
Keywords
disc drives; distance measurement; hard discs; light interferometers; light interferometry; light polarisation; dual-beam interferometer; flying height testing; head slider optical parameters; head-disk spacing; head-slider pitch; head-slider roll; normal incidence polarization interferometry; rigid disc design; Glass; Laser beams; Magnetic analysis; Memory; Optical interferometry; Optical polarization; Optical sensors; Performance evaluation; Testing; Time measurement;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.951015
Filename
951015
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