Title :
Cavity current enhancement by dielectrics
Author :
Little, R.G. ; Lowell, R. ; Uglum, J.R.
Author_Institution :
Simulation Physics, Inc. Burlington, MA 01803
Abstract :
Charge transport within cavities is a complicated phenomena, depending on injected beam parameters, pressure and the geometry of the cavity. If there are complex distributions of conductors and/or dielectrics within the structure, an understanding of how these can affect propogation is fundamental to categorizing IEMP phenomenology.
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1974.6498936
