Fine-scale spatial response of CdZnTe radiation detectors

Author

Brunett, B.A. ; Van Scyoc, J.M. ; Hilton, N.R. ; Lund, J.C. ; James, R.B. ; Schlesinger, T.E.

Author_Institution

Sandia Nat. Labs., Livermore, CA, USA

Volume

46

Issue

3

fYear

1999

fDate

6/1/1999 12:00:00 AM

Firstpage

237

Lastpage

242

Abstract

Several studies have suggested that the uniformity of Cadmium Zinc Telluride (CZT) detectors play an important role in their performance when operated as gamma-ray spectrometers. However, the detailed gamma response of simple planar detectors as a function of position over the device area is largely unknown. To address this issue we have built a system capable of measuring the detector response with a resolution of ~250 μm. The system consists of a highly collimated (~200 μm) photon source (<150 keV) scanned over the detector using a computer controlled, two-axis translation stage. Fifteen samples configured as planar detectors were examined with the new apparatus. The material grade of the detectors examined varied from “counter” to “select discriminator”. Two classes of spatial response variation were observed and are presented here. Infrared (IR) transmission images were also acquired for each sample and correlation between features in the pulse height spectrum and crystalline defects were observed

Keywords

II-VI semiconductors; cadmium compounds; gamma-ray spectrometers; semiconductor counters; CdZnTe; CdZnTe radiation detectors; crystalline defects; detector response; fine-scale spatial response; gamma-ray spectrometers; infrared transmission images; pulse height spectrum; spatial response variation; two-axis translation stage; Cadmium compounds; Control systems; Gamma ray detection; Gamma ray detectors; Optical collimators; Optical computing; Optical control; Radiation detectors; Spectroscopy; Zinc compounds;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.775521

Filename

775521