Title :
Integrated circuit model development for EMP
Author :
Kleiner, Carsten ; Nelson, John ; Vassallo, F. ; Heaton, E.
Author_Institution :
Rockwell International Autonetics Anaheim, California
Abstract :
The response of Integrated Circuits (IC) to pulsed snd gated sine-wave stimuli can be used to develop reasonably accurate device models for EMP assessment. These IC models can then be used in conjunction with circuit and transfer function models to determine the failure threshold (upset and burnout) to postulated EMP distrubance.
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1974.6498948
