• DocumentCode
    1531107
  • Title

    Integrated circuit model development for EMP

  • Author

    Kleiner, Carsten ; Nelson, John ; Vassallo, F. ; Heaton, E.

  • Author_Institution
    Rockwell International Autonetics Anaheim, California
  • Volume
    21
  • Issue
    6
  • fYear
    1974
  • Firstpage
    323
  • Lastpage
    331
  • Abstract
    The response of Integrated Circuits (IC) to pulsed snd gated sine-wave stimuli can be used to develop reasonably accurate device models for EMP assessment. These IC models can then be used in conjunction with circuit and transfer function models to determine the failure threshold (upset and burnout) to postulated EMP distrubance.
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1974.6498948
  • Filename
    6498948
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1531107