Measurement and prediction techniques for DC to DC converter failure modes

Dc to dc converter circuits in an ionizing environment are vulnerable to two common failure modes: overcurrent and second breakdown. This paper presents a study of these failure modes using a combination of laboratory tests, computer simulations, and super flash X-ray (SFXR) tests. Special techniques were used to measure a single load line transition in an actual SFXR environment and to predict these critical operating conditions using a widely distributed circuit analysis computer code. The results of the laboratory electrical tests, digital computer simulations, and SFXR tests were in good agreement, placing confidence in the ability to simulate, measure, and predict the failure modes associated with this type of dc to dc converter in an SFXR environment.