Title :
GEM: Performance and aging tests
Author :
Cho, H.S. ; Kadyk, J. ; Han, S.H. ; Hong, W.S. ; Perez-Mendez, V. ; Wenzel, W. ; Pitts, K. ; Martin, M.D. ; Hutchins, J.B.
Author_Institution :
Div. of Phys., Lawrence Berkeley Lab., CA, USA
fDate :
6/1/1999 12:00:00 AM
Abstract :
Performance and aging tests have been done to characterize Gas Electron Multipliers (GEMs), including further design improvements such as a thicker GEM and a closed GEM. Since the effective GEM gain is typically smaller than the absolute GEM gain, due to trapping of avalanche electrons at the bottom GEM electrode, we performed field simulations and measurements for better understanding, and discuss methods to eliminate this effect. Other performance parameters of the GEMs are also presented, including absolute GEM gain, short-term and long-term gain stabilities
Keywords :
avalanche breakdown; electron multiplier detectors; Gas Electron Multipliers; aging tests; avalanche electron trapping; field simulations; long-term gain stabilities; short-term gain stabilities; Aging; Charge carrier processes; Electrodes; Electrons; Geometry; Optical microscopy; Performance gain; Physics; Stability; Testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
