DocumentCode
1531170
Title
GEM: Performance and aging tests
Author
Cho, H.S. ; Kadyk, J. ; Han, S.H. ; Hong, W.S. ; Perez-Mendez, V. ; Wenzel, W. ; Pitts, K. ; Martin, M.D. ; Hutchins, J.B.
Author_Institution
Div. of Phys., Lawrence Berkeley Lab., CA, USA
Volume
46
Issue
3
fYear
1999
fDate
6/1/1999 12:00:00 AM
Firstpage
306
Lastpage
311
Abstract
Performance and aging tests have been done to characterize Gas Electron Multipliers (GEMs), including further design improvements such as a thicker GEM and a closed GEM. Since the effective GEM gain is typically smaller than the absolute GEM gain, due to trapping of avalanche electrons at the bottom GEM electrode, we performed field simulations and measurements for better understanding, and discuss methods to eliminate this effect. Other performance parameters of the GEMs are also presented, including absolute GEM gain, short-term and long-term gain stabilities
Keywords
avalanche breakdown; electron multiplier detectors; Gas Electron Multipliers; aging tests; avalanche electron trapping; field simulations; long-term gain stabilities; short-term gain stabilities; Aging; Charge carrier processes; Electrodes; Electrons; Geometry; Optical microscopy; Performance gain; Physics; Stability; Testing;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.775534
Filename
775534
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