Title :
A 160
120-Pixels Range Camera With In-Pixel Correlated Double Sampling and Fixed-Pattern Noise Correction
Author :
Perenzoni, Matteo ; Massari, Nicola ; Stoppa, David ; Pancheri, Lucio ; Malfatti, Mattia ; Gonzo, Lorenzo
Author_Institution :
Fondazione Bruno Kessler (FBK), Povo, Italy
fDate :
7/1/2011 12:00:00 AM
Abstract :
This paper presents the design and electro-optical test of a 160 × 120-pixels CMOS sensor specifically conceived for Time-Of-Flight 3D imaging. The in-pixel processing allows the implementation of Indirect Time-Of-Flight technique for distance measurement with reset noise removal through Correlated Double Sampling and embedded fixed-pattern noise reduction, whereas a fast readout operation allows the pixels values to be streamed out at a maximum rate of 10 MSample/s. The imager can operate as a fast 2D camera up to 458 fps, as a 3D camera up to 80 fps, or even coupling both operation modes. The chip has been fabricated using a standard 0.18 μm 1P4M 1.8 V CMOS technology with MIM capacitors. The resulting pixel has a pitch of 29.1 μm with a fill-factor of 34% and includes 66 transistors. Distance measurements up to 4.5 m have been performed with pulsed laser light, achieving a best precision of 10 cm at 1 m in real-time at 55 fps and 175 mA current consumption.
Keywords :
CMOS image sensors; MIM devices; cameras; capacitors; distance measurement; 1P4MCMOS technology; 2D camera; 3D camera; CMOS image sensor; MIM capacitors; current 175 mA; current consumption; distance 4.5 m; distance measurement; electro-optical test; embedded fixed-pattern noise reduction; fixed-pattern noise correction; in-pixel correlated double sampling; noise removal; pixel range camera; pulsed laser light; size 0.18 mum; time-of-flight 3D imaging; voltage 1.8 V; CMOS integrated circuits; Cameras; Consumer electronics; Measurement by laser beam; Noise; Pixel; Three dimensional displays; 3D camera; CMOS; correlated double sampling; high-speed imager; image sensor; non-uniformity correction; range finding; three-dimensional image sensor; time-of-flight;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2011.2144130