Title :
Hall-magnetometry on ferromagnetic micro-rhombs
Author :
Rahn, M. ; Bentner, J. ; Biberger, J. ; Schneider, M. ; Zweck, J. ; Schuh, D. ; Weiss, D.
Author_Institution :
Inst. for Appl. & Exp. Phys., Regensburg Univ., Germany
fDate :
7/1/2001 12:00:00 AM
Abstract :
Micropatterned Hall-sensors are used to measure the magnetic switching of nanopatterned rhombic Ni-elements at temperatures below 1.2 K. The length of the short axis (“waist”) was systematically varied between 700 and 100 nm while the length of 2 μm of the long axis was kept fixed. The thickness of the Ni-rhombs was 70 nm. Whereas the hysteresis loops of the broader rhombs show many small steps, which seem to be connected to domain wall movement and pinning, the narrowest two only reveal one single step during magnetization reversal. The process of magnetization reversal is additionally studied by Lorentz transmission electron microscopy. Placing Hall-sensors on both ends of acicular Ni elements allows one to investigate the switching process on both sides simultaneously
Keywords :
ferromagnetic materials; magnetic hysteresis; magnetic particles; magnetic switching; magnetisation reversal; nickel; transmission electron microscopy; 70 nm; 700 to 100 nm; Hall-magnetometry; Lorentz transmission electron microscopy; Ni; acicular Ni elements; domain wall movement; ferromagnetic micro-rhombs; hysteresis loops; magnetic switching; magnetization reversal; micropatterned Hall-sensors; nanopatterned rhombic Ni-elements; pinning; Electrons; Hall effect devices; Magnetic field measurement; Magnetic hysteresis; Magnetic properties; Magnetic switching; Magnetization reversal; Nanopatterning; Shape; Temperature;
Journal_Title :
Magnetics, IEEE Transactions on
