• DocumentCode
    1531663
  • Title

    Linear Regression for Face Recognition

  • Author

    Naseem, Imran ; Togneri, Roberto ; Bennamoun, Mohammed

  • Author_Institution
    Sch. of Electr., Electron. & Comput. Eng., Univ. of Western Australia, Crawley, WA, Australia
  • Volume
    32
  • Issue
    11
  • fYear
    2010
  • Firstpage
    2106
  • Lastpage
    2112
  • Abstract
    In this paper, we present a novel approach of face identification by formulating the pattern recognition problem in terms of linear regression. Using a fundamental concept that patterns from a single-object class lie on a linear subspace, we develop a linear model representing a probe image as a linear combination of class-specific galleries. The inverse problem is solved using the least-squares method and the decision is ruled in favor of the class with the minimum reconstruction error. The proposed Linear Regression Classification (LRC) algorithm falls in the category of nearest subspace classification. The algorithm is extensively evaluated on several standard databases under a number of exemplary evaluation protocols reported in the face recognition literature. A comparative study with state-of-the-art algorithms clearly reflects the efficacy of the proposed approach. For the problem of contiguous occlusion, we propose a Modular LRC approach, introducing a novel Distance-based Evidence Fusion (DEF) algorithm. The proposed methodology achieves the best results ever reported for the challenging problem of scarf occlusion.
  • Keywords
    face recognition; image classification; inverse problems; least squares approximations; regression analysis; distance-based evidence fusion algorithm; face recognition; inverse problem; least-squares method; linear regression classification algorithm; minimum reconstruction error; modular LRC approach; nearest subspace classification; pattern recognition problem; Classification algorithms; Databases; Face recognition; Image reconstruction; Inverse problems; Least squares methods; Linear regression; Pattern recognition; Probes; Protocols; Face recognition; linear regression; nearest subspace classification.; Algorithms; Artificial Intelligence; Biometry; Face; Female; Humans; Image Enhancement; Image Interpretation, Computer-Assisted; Least-Squares Analysis; Linear Models; Male; Pattern Recognition, Automated;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2010.128
  • Filename
    5506092