Title :
Demonstration of Nanomachining With Focused Extreme Ultraviolet Laser Beams
Author :
Bravo, Herman ; Szapiro, Ben T. ; Wachulak, Przemyslaw W. ; Marconi, Mario C. ; Chao, Weilun ; Anderson, Erik H. ; Menoni, Carmen S. ; Rocca, Jorge J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Colorado State Univ., Fort Collins, CO, USA
Abstract :
A major challenge in laser machining of microstructures is that of extending the spatial domain to the smaller dimensions of interest in nanotechnology. We demonstrate the feasibility of directly machining nanoscale structures with a focused extreme ultraviolet (EUV) laser beam. Clean sub-200-nm-wide trenches (130-nm full width at half maximum) were ablated on polymethyl methacrylate photoresist by focusing the 46.9-nm wavelength beam from a Ne-like Ar capillary discharge tabletop laser with a Fresnel zone plate lens. Considering that clean 82-nm holes were also ablated using the same laser, it can be expected that focused EUV laser light will enable the machining of significantly smaller features.
Keywords :
argon; gas lasers; laser ablation; laser beam machining; lenses; micromachining; nanofabrication; nanotechnology; optical focusing; photoresists; zone plates; Ar; Fresnel zone plate lens; capillary discharge tabletop laser; focused extreme ultraviolet laser beams; focusing; laser ablation; laser machining; microstructures; nanomachining; nanotechnology; polymethyl methacrylate photoresist; size 200 nm; size 82 nm; wavelength 46.9 nm; Laser ablation; Laser beams; Laser theory; Ultrafast optics; Ultraviolet sources; X-ray lasers; Extreme ultraviolet (EUV) lasers; laser ablation; nanomachining; nanotechology;
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
DOI :
10.1109/JSTQE.2011.2158392