Title :
Integrating tester pin electronics
Author :
Branson, Christopher W.
Author_Institution :
Tektronix, Beaverton, OR, USA
fDate :
4/1/1990 12:00:00 AM
Abstract :
A 10-V pin electronics driver that can output signals with low distortion and fast risetimes for both narrow and wide voltage swings is described. The features combine to eliminate the need for dual drivers, pin cards, or test heads, which simplifies the testing of mixed-technology devices or modules. A high-voltages process module has been added to a standard 1.5- mu m digital CMOS process, which allows the driver to be in the same silicon as the timing and formatting circuitry. Design and calibration techniques that overcome the limitations of the high-voltage CMOS process are examined.<>
Keywords :
CMOS integrated circuits; integrated circuit testing; logic testing; 1.5 micron; 10 V; 10-V pin electronics driver; calibration; digital CMOS process; formatting circuitry; integrating tester pin electronics; timing; CMOS technology; Circuit testing; Costs; Driver circuits; Electronic equipment testing; Integrated circuit testing; Pins; Software testing; System testing; Very large scale integration;
Journal_Title :
Design & Test of Computers, IEEE
