Title :
Observation of nearly intrinsic ferromagnetic resonance linewidth in BaFe12O19 films deposited by pulsed laser deposition
Author :
Saraf, L.V. ; Lofland, S.E. ; Von Cresce, Arthur ; Monga, A.P. ; Bhagat, S.M. ; Ramesh, R.
Author_Institution :
Dept. of Mater. Eng., Maryland Univ., College Park, MD, USA
fDate :
7/1/2001 12:00:00 AM
Abstract :
We report magnetic resonance results on (0.3-8 μm) films of c-axis oriented barium ferrite grown by pulsed laser deposition on sapphire substrates. By optimizing the growth and annealing parameters, we have observed numerous (up to 25) spin wave resonance modes as well as nearly intrinsic ferromagnetic resonance linewidth of 23 Oe at 58 GHz, when the applied field is parallel to the c axis. On rotation of the field away from the film normal, the linewidth increases rapidly. This is taken in to account by using a small (0.3°) spread in the film orientation combined with the conventional formula for shape anisotropy. Atomic force microscopy surface roughness measurements support these considerations
Keywords :
atomic force microscopy; barium compounds; ferrites; ferromagnetic resonance; pulsed laser deposition; spectral line breadth; surface topography; 0.3 to 8 mum; 58 GHz; Al2O3; BaFe12O19; BaFe12O19 films; annealing parameters; applied field; atomic force microscopy surface roughness measurements; c-axis oriented barium ferrite; film orientation; growth; magnetic resonance; nearly intrinsic ferromagnetic resonance linewidth; pulsed laser deposition; sapphire substrates; shape anisotropy; spin wave resonance modes; Atomic force microscopy; Atomic measurements; Barium; Ferrite films; Force measurement; Laser modes; Magnetic films; Magnetic resonance; Optical pulses; Pulsed laser deposition;
Journal_Title :
Magnetics, IEEE Transactions on
