Microprocessor-based system for full automation and on-line measurement of conductivity in amorphous semiconductor

A microprocessor-based system has been developed to automate measurement and provide online calculation of conductivity in amorphous semiconductor. The system improves the accuracy of recorded data, eliminates varying degrees of human participation, and saves operator´s time. A microprocessor controls all system operations, performs data logging and processing, and makes decisions relative to the acceptability of the measured values of the sample current and temperature. Results obtained and quantitative accuracy are presented and used to evaluate the performance characteristics of the system.