• DocumentCode
    1532066
  • Title

    The frequency-temperature analysis equations of piezoelectric plates with Lee plate theory

  • Author

    Wang, Ji

  • Author_Institution
    Epson Palo Alto Lab., CA, USA
  • Volume
    46
  • Issue
    4
  • fYear
    1999
  • fDate
    7/1/1999 12:00:00 AM
  • Firstpage
    1042
  • Lastpage
    1046
  • Abstract
    Frequency-temperature analysis theory of crystal plates based on the incremental field theory (IFT) and the Mindlin plate theory have been widely used in the vibration analysis of crystal resonators subject to temperature change. As one of the two major plate theories for the resonator analysis, the Lee plate theory based on the trigonometric series expansion of displacements has been extensively used for both analytical and numerical analyses of quartz resonators, and efforts have also been made in correcting and perfecting the theory for much broader applications. In this paper, the earlier frequency-temperature analysis equations based on the IFT is further extended to the trigonometric series expansion in a systematic manner. By incorporating the frequency-temperature analysis into the Lee plate theory, the complete analysis of crystal resonators can be made in a consistent way. The thickness-shear and flexural vibration equations have been compared with the Mindlin plate theory to demonstrate the similarity and consistency.
  • Keywords
    crystal resonators; deformation; equations; series (mathematics); thermal analysis; vibrations; Lee plate theory; crystal resonators; displacements; flexural vibration equations; frequency-temperature analysis equations; piezoelectric plates; resonator analysis; thickness-shear equations; trigonometric series expansion; Capacitive sensors; Differential equations; Elasticity; Electrical capacitance tomography; Frequency; Geometry; Numerical analysis; Temperature; Thermal expansion; Thermal stresses;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/58.775672
  • Filename
    775672