DocumentCode :
1532075
Title :
Remote Labs for Industrial IC Testing
Author :
Pradarelli, Béatrice ; Latorre, Laurent ; Flottes, Marie-Lise ; Bertrand, Yoann ; Nouet, Pascal
Author_Institution :
Support Tech. et Pedagogique du CRTC, Pole CNFM de Montpellier, Montpellier, France
Volume :
2
Issue :
4
fYear :
2009
Firstpage :
304
Lastpage :
311
Abstract :
This paper deals with the remote access to an Integrated Circuits (ICs) Automated Test Equipment (ATE) for both educational and engineering purposes. This experience was initiated in 1998 in the context of a French network (CNFM) in order to provide a distant control to industrial equipment to academic and industrial people. The actual shared resource is a Verigy V93K System-on-Chip (SoC) tester platform. The cost of such equipment is close to 1 million dollar, without taking into account the maintenance and attached human resources expenses to make it work properly daily. Although the sharing of such equipments seems to be obvious for education, the French experience is quite a unique example in the world. The paper introduces the context of industrial IC testing and justifies the introduction of labs in Electrical Engineering curricula. Practical information regarding IC testing and network setup for remote access are detailed, together with lab contents.
Keywords :
automatic test equipment; computer aided instruction; electronic engineering computing; electronic engineering education; integrated circuit testing; laboratories; system-on-chip; telecontrol; Verigy V93K system-on-chip tester; automated test equipment; electrical engineering curriculum; industrial IC testing; remote laboratories; Context; Data mining; Decision support systems; Software; System-on-a-chip; Testing; ATE programming.; Test; remote labs; testability;
fLanguage :
English
Journal_Title :
Learning Technologies, IEEE Transactions on
Publisher :
ieee
ISSN :
1939-1382
Type :
jour
DOI :
10.1109/TLT.2009.46
Filename :
5306065
Link To Document :
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