• DocumentCode
    1532130
  • Title

    10-V round-robin test conducted on a solid-state DC voltage standard

  • Author

    Becker, Latika S.R. ; Field, Bruce F. ; Kiess, Thomas E.

  • Author_Institution
    U.S. Army Test, Measurement, and Diagnostic Equipment Support Group, Redstone Arsenal, AL 35898; U.S. Army Strategic Defense Command, DASD-H-F, Huntsville, AL 35807
  • Issue
    4
  • fYear
    1986
  • Firstpage
    383
  • Lastpage
    386
  • Abstract
    A round-robin comparison of 10-V dc standards was conducted through the cooperative efforts of the U.S. Primary Standards Laboratory, U.S. Navy East and West Laboratories, U.S. Air Force Primary Standards Laboratory (APSL), and the National Bureau of Standards (NBS). A transfer uncertainty of 0.11 ppm (95-percent confidence interval) was obtained using solid-state dc voltage references. This paper describes the round-robin test, presents the results obtained in the evaluation of the transfer uncertainty of 10-V solid-state standards, and provides information on the relative quality of various test methods used in this round-robin.
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.1986.6499102
  • Filename
    6499102