DocumentCode
1532130
Title
10-V round-robin test conducted on a solid-state DC voltage standard
Author
Becker, Latika S.R. ; Field, Bruce F. ; Kiess, Thomas E.
Author_Institution
U.S. Army Test, Measurement, and Diagnostic Equipment Support Group, Redstone Arsenal, AL 35898; U.S. Army Strategic Defense Command, DASD-H-F, Huntsville, AL 35807
Issue
4
fYear
1986
Firstpage
383
Lastpage
386
Abstract
A round-robin comparison of 10-V dc standards was conducted through the cooperative efforts of the U.S. Primary Standards Laboratory, U.S. Navy East and West Laboratories, U.S. Air Force Primary Standards Laboratory (APSL), and the National Bureau of Standards (NBS). A transfer uncertainty of 0.11 ppm (95-percent confidence interval) was obtained using solid-state dc voltage references. This paper describes the round-robin test, presents the results obtained in the evaluation of the transfer uncertainty of 10-V solid-state standards, and provides information on the relative quality of various test methods used in this round-robin.
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.1986.6499102
Filename
6499102
Link To Document