Title :
8-ns CMOS 64 K×4 and 256 K×1 SRAMs
Author :
Flannagan, Stephen T. ; Pelley, Perry H. ; Herr, Norman ; Engles, Bruce E. ; Feng, Taisheng ; Nogle, Scott G. ; Eagan, John W. ; Dunnigan, Robert J. ; Day, Lawrence J. ; Kung, Roger I.
Author_Institution :
Motorola Semicond. Products, Austin, TX, USA
fDate :
10/1/1990 12:00:00 AM
Abstract :
SRAMs (static random-access memory) with a 64 K×4 and 256 K×1 structure and with 8-ns access time have been developed on a 1.0-μm CMOS process. Circuits are designed with source-coupling techniques to achieve high speed with small signal swings, using only CMOS devices. A metal option permits selection of the 64 K×4 or 256 K×1 configuration. The same core architecture has also been used to generate ×8 and ×9 designs. An output-enable (OE) version achieves 3-ns response time. As system speeds have recently increased toward 100-MHz operation, the need for address transition detection (ATD) has diminished as a means for improving the SRAM speed/power ratio. This trend in SRAM design stems mainly from the fact that AC current becomes the most significant fraction of the total current. Accordingly, the design described here employs a purely static path through the entire SRAM, with no requirement of ATD at any point. The resulting DC current is countered with a combined strategy of array subdivision, small-signal techniques, and active preamplification at key points in the data path
Keywords :
CMOS integrated circuits; SRAM chips; 1 micron; 256 kbit; 8 ns; AC current; CMOS process; SRAM; active preamplification; array subdivision; small-signal techniques; source-coupling techniques; static random-access memory; BiCMOS integrated circuits; CMOS technology; Capacitance; Clocks; Energy consumption; Frequency; Hysteresis; Pulse amplifiers; Random access memory; Signal design;
Journal_Title :
Solid-State Circuits, IEEE Journal of