• DocumentCode
    1532218
  • Title

    The capacitor-voltage variance matrix of passive thermal-noisy RC networks

  • Author

    Goette, Josef

  • Author_Institution
    Swiss Federal Inst. of Technol. Zurich, Switzerland
  • Volume
    37
  • Issue
    7
  • fYear
    1990
  • fDate
    7/1/1990 12:00:00 AM
  • Firstpage
    954
  • Lastpage
    959
  • Abstract
    The features of the stationary capacitor-voltage variances and covariances that arise in passive RC networks due to thermal resistor noise are investigated, and an efficient procedure is devised to compute the corresponding variance matrix. For this purpose, a closed-form expression for the investigated variance matrix is derived that shows that the capacitor-voltage (co)variances are functions of kT (Boltzmann´s constant times absolute temperature), the circuit topology, and the capacitor values, but are not functions of the resistor values as in more general networks. By two simple topological checks, a given passive thermal-noisy RC network can be assigned to one of four subclasses, the one exhibiting the most simple (co)variance structure having kT/Ci variances and zero covariances. The proposed practical implementation of the topological checks leads to a procedure that achieves considerable simplifications in computing the capacitor-voltage variance matrix as compared to conventional approaches, which are devised for more general networks and do not make use of the special features of the passive thermal-noisy RC networks. The motivation for treating this problem is the noise analysis in switched-capacitor circuits
  • Keywords
    matrix algebra; network topology; passive networks; thermal noise; Boltzmann´s constant; capacitor values; capacitor-voltage variance matrix; circuit topology; closed-form expression; passive thermal-noisy RC networks; switched-capacitor circuits; thermal resistor noise; topological checks; variance matrix; Capacitors; Circuit analysis; Circuit noise; Circuit topology; Closed-form solution; Computer networks; Covariance matrix; Resistors; Temperature; Thermal resistance;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0098-4094
  • Type

    jour

  • DOI
    10.1109/31.55072
  • Filename
    55072