Dynamic testing of a slow sample rate, high-resolution data acquisition system

Performance testing a slow sample rate, high-resolution data acquisition system (DAS) is difficult due to the large number of possible codes and the time required to fully exercise them. Techniques for dynamically testing such a system are considered with advantages and disadvantages presented. The system resolution is 15 bits, sampling frequency is 128 Hz, input range is ±5 V, and the maximum input frequency is 45 Hz. Two techniques chosen to evaluate the system are the histogram method and the discrete Fourier transform (DFT) method.