Title :
Monitoring circuit based on threshold for fault-tolerant NoC
Author :
Dai, Lin ; Shang, D. ; Xia, Feng ; Yakovlev, Alex
Author_Institution :
Key Lab. of Wide Band-Gap Semicond. Mater. & Devices, Xidian Univ., Xi´an, China
fDate :
7/1/2010 12:00:00 AM
Abstract :
As CMOS technology continues to scale down, reliability has become one of the most crucial issues in network-on-chip (NoC). A novel NoC monitoring circuit based on fault thresholds is proposed. This circuit is able to distinguish not only transient faults but also non-transient faults in NoC data links and routers with low area and power overhead.
Keywords :
CMOS integrated circuits; circuit reliability; fault tolerance; network routing; network-on-chip; CMOS technology; NoC data links; fault thresholds; fault-tolerant NoC routers; monitoring circuit; network-on-chip; power overhead; transient faults;
Journal_Title :
Electronics Letters
DOI :
10.1049/el.2010.0634
