DocumentCode
1532450
Title
Breakdown Voltage for Superjunction Power Devices With Charge Imbalance: An Analytical Model Valid for Both Punch Through and Non Punch Through Devices
Author
Wang, Han ; Napoli, Ettore ; Udrea, Florin
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Massachusetts Inst. of Technol., Cambridge, MA, USA
Volume
56
Issue
12
fYear
2009
Firstpage
3175
Lastpage
3183
Abstract
An analytical model for the electric field and the breakdown voltage (BV) of an unbalanced superjunction (SJ) device is presented in this paper. The analytical technique uses a superposition approach treating the asymmetric charge in the pillars as an excess charge component superimposed on a balanced charge component. The proposed double-exponential model is able to accurately predict the electric field and the BV for unbalanced SJ devices in both punch through and non punch through conditions. The model is also reasonably accurate at extremely high levels of charge imbalance when the devices behave similarly to a PiN diode or to a high-conductance layer. The analytical model is compared against numerical simulations of charge unbalanced SJ devices and against experimental results.
Keywords
electric breakdown; power semiconductor devices; semiconductor device models; semiconductor junctions; breakdown voltage; charge imbalance; double-exponential model; power semiconductor devices; semiconductor device modelling; superjunction power devices; superposition approach; Analytical models; Degradation; Equations; MOSFETs; Numerical simulation; Physics; Power semiconductor devices; Predictive models; Semiconductor device modeling; Analytical model; SJ modeling; charge imbalance (C.I.); power semiconductor devices; semiconductor device modeling; superjunction (SJ);
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2009.2032595
Filename
5306120
Link To Document