DocumentCode :
1532450
Title :
Breakdown Voltage for Superjunction Power Devices With Charge Imbalance: An Analytical Model Valid for Both Punch Through and Non Punch Through Devices
Author :
Wang, Han ; Napoli, Ettore ; Udrea, Florin
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Massachusetts Inst. of Technol., Cambridge, MA, USA
Volume :
56
Issue :
12
fYear :
2009
Firstpage :
3175
Lastpage :
3183
Abstract :
An analytical model for the electric field and the breakdown voltage (BV) of an unbalanced superjunction (SJ) device is presented in this paper. The analytical technique uses a superposition approach treating the asymmetric charge in the pillars as an excess charge component superimposed on a balanced charge component. The proposed double-exponential model is able to accurately predict the electric field and the BV for unbalanced SJ devices in both punch through and non punch through conditions. The model is also reasonably accurate at extremely high levels of charge imbalance when the devices behave similarly to a PiN diode or to a high-conductance layer. The analytical model is compared against numerical simulations of charge unbalanced SJ devices and against experimental results.
Keywords :
electric breakdown; power semiconductor devices; semiconductor device models; semiconductor junctions; breakdown voltage; charge imbalance; double-exponential model; power semiconductor devices; semiconductor device modelling; superjunction power devices; superposition approach; Analytical models; Degradation; Equations; MOSFETs; Numerical simulation; Physics; Power semiconductor devices; Predictive models; Semiconductor device modeling; Analytical model; SJ modeling; charge imbalance (C.I.); power semiconductor devices; semiconductor device modeling; superjunction (SJ);
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2009.2032595
Filename :
5306120
Link To Document :
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