• DocumentCode
    1532450
  • Title

    Breakdown Voltage for Superjunction Power Devices With Charge Imbalance: An Analytical Model Valid for Both Punch Through and Non Punch Through Devices

  • Author

    Wang, Han ; Napoli, Ettore ; Udrea, Florin

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Massachusetts Inst. of Technol., Cambridge, MA, USA
  • Volume
    56
  • Issue
    12
  • fYear
    2009
  • Firstpage
    3175
  • Lastpage
    3183
  • Abstract
    An analytical model for the electric field and the breakdown voltage (BV) of an unbalanced superjunction (SJ) device is presented in this paper. The analytical technique uses a superposition approach treating the asymmetric charge in the pillars as an excess charge component superimposed on a balanced charge component. The proposed double-exponential model is able to accurately predict the electric field and the BV for unbalanced SJ devices in both punch through and non punch through conditions. The model is also reasonably accurate at extremely high levels of charge imbalance when the devices behave similarly to a PiN diode or to a high-conductance layer. The analytical model is compared against numerical simulations of charge unbalanced SJ devices and against experimental results.
  • Keywords
    electric breakdown; power semiconductor devices; semiconductor device models; semiconductor junctions; breakdown voltage; charge imbalance; double-exponential model; power semiconductor devices; semiconductor device modelling; superjunction power devices; superposition approach; Analytical models; Degradation; Equations; MOSFETs; Numerical simulation; Physics; Power semiconductor devices; Predictive models; Semiconductor device modeling; Analytical model; SJ modeling; charge imbalance (C.I.); power semiconductor devices; semiconductor device modeling; superjunction (SJ);
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2009.2032595
  • Filename
    5306120