Title :
Barium and strontium ferrite perpendicular thin film media with a sendust soft magnetic underlayer
Author :
Zhuang, Zailong ; Bian, Bo ; White, Robert M. ; Laughlin, David E.
Author_Institution :
Data Storage Syst. Center, Carnegie Mellon Univ., Pittsburgh, PA, USA
fDate :
7/1/2001 12:00:00 AM
Abstract :
The possibility of using sendust (FeAlSi) as the soft magnetic underlayer for hexagonal barium ferrite (BaM) and strontium ferrite (SrM) was studied. Sendust films were found to retain their soft magnetic properties with a rapid thermal anneal (RTA) at 800 C for 60 s, which is necessary to crystallize the as-deposited amorphous BaM and SrM films. Several film structures with sendust films as the soft underlayer were studied and compared. Strong hcp (001) texture and bcc (110) texture were obtained on the BaM(SrM)/Pt/buffer/FeAlSi/Si multi-layer structure films, as indicated by the strong hcp (006), (008) and (0014) reflections for BaM(SrM) layer and bcc (110) reflection for the sendust underlayer from X-ray diffraction measurements.
Keywords :
X-ray diffraction; aluminium alloys; barium compounds; coercive force; ferrites; grain growth; iron alloys; magnetic hysteresis; magnetic multilayers; perpendicular magnetic recording; rapid thermal annealing; silicon alloys; soft magnetic materials; sputtered coatings; strontium compounds; texture; 60 s; 800 C; BaFe/sub 12/O/sub 19/-Pt-FeAlSi-Si; SrFe/sub 12/O/sub 19/-Pt-FeAlSi-Si; X-ray diffraction; coercivity; ferrite perpendicular thin film media; grain growth; hysteresis; multilayer structure films; rapid thermal anneal; sendust soft magnetic underlayer; soft magnetic properties; sputtered films; textured growth; Amorphous magnetic materials; Barium; Ferrite films; Magnetic films; Magnetic properties; Optical films; Reflection; Soft magnetic materials; Strontium; Transistors;
Journal_Title :
Magnetics, IEEE Transactions on
