• DocumentCode
    1532506
  • Title

    Effect of Cr underlayer on microstructure and magnetic properties of Sm/sub 2/Co/sub 17/ thin films

  • Author

    Chen, Shi-Kun ; Wu, G.Y. ; Tsai, Jai-Lin ; Chin, Tsung-Shune

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Feng Chia Univ., Taichung, Taiwan
  • Volume
    37
  • Issue
    4
  • fYear
    2001
  • fDate
    7/1/2001 12:00:00 AM
  • Firstpage
    2593
  • Lastpage
    2595
  • Abstract
    Sm2Co17 thin films were deposited on a Cr underlayer by dc magnetron sputtering. Sm2Co17(300) in-plane texture was observed as the thickness of the Cr underlayer was in the range of 100–300 nm. The exchange coupling effect of the Sm2Co17 films was investigated from ΔM plots. The Cr underlayer was found to play an important role in decreasing the intergranular interactions in the Sm2Co17 films because of the formation of granular structure. TEM micrographs indicate that the magnetic decoupling can be due to isolated Sm2Co17 magnetic clusters which is induced by a Cr(110) textured underlayer.
  • Keywords
    chromium; cobalt alloys; exchange interactions (electron); ferromagnetic materials; magnetic thin films; samarium alloys; sputtered coatings; transmission electron microscopy; Cr; Cr underlayer; DC magnetron sputtering; Sm/sub 2/Co/sub 17/; Sm/sub 2/Co/sub 17/ thin film; TEM; exchange coupling; granular structure; in-plane texture; intergranular interaction; magnetic clusters; magnetic decoupling; magnetic properties; microstructure; Amorphous magnetic materials; Chromium; Magnetic field measurement; Magnetic films; Magnetic hysteresis; Magnetic properties; Microstructure; Remanence; Samarium; Sputtering;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.951245
  • Filename
    951245