DocumentCode
1532506
Title
Effect of Cr underlayer on microstructure and magnetic properties of Sm/sub 2/Co/sub 17/ thin films
Author
Chen, Shi-Kun ; Wu, G.Y. ; Tsai, Jai-Lin ; Chin, Tsung-Shune
Author_Institution
Dept. of Mater. Sci. & Eng., Feng Chia Univ., Taichung, Taiwan
Volume
37
Issue
4
fYear
2001
fDate
7/1/2001 12:00:00 AM
Firstpage
2593
Lastpage
2595
Abstract
Sm2Co17 thin films were deposited on a Cr underlayer by dc magnetron sputtering. Sm2Co17(300) in-plane texture was observed as the thickness of the Cr underlayer was in the range of 100–300 nm. The exchange coupling effect of the Sm2Co17 films was investigated from ΔM plots. The Cr underlayer was found to play an important role in decreasing the intergranular interactions in the Sm2Co17 films because of the formation of granular structure. TEM micrographs indicate that the magnetic decoupling can be due to isolated Sm2Co17 magnetic clusters which is induced by a Cr(110) textured underlayer.
Keywords
chromium; cobalt alloys; exchange interactions (electron); ferromagnetic materials; magnetic thin films; samarium alloys; sputtered coatings; transmission electron microscopy; Cr; Cr underlayer; DC magnetron sputtering; Sm/sub 2/Co/sub 17/; Sm/sub 2/Co/sub 17/ thin film; TEM; exchange coupling; granular structure; in-plane texture; intergranular interaction; magnetic clusters; magnetic decoupling; magnetic properties; microstructure; Amorphous magnetic materials; Chromium; Magnetic field measurement; Magnetic films; Magnetic hysteresis; Magnetic properties; Microstructure; Remanence; Samarium; Sputtering;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.951245
Filename
951245
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