Title :
Investigation of On-Chip Soft-Ferrite-Integrated Inductors for RF ICs—Part II: Experiments
Author :
Yang, Chen ; Liu, Feng ; Wang, Xin ; Zhan, Jing ; Wang, Albert ; Ren, Tian-Ling ; Liu, Li-Tian ; Long, Haibo ; Wu, Zhengzheng ; Li, Xinxin
Author_Institution :
Inst. of Microelectron., Tsinghua Univ., Beijing, China
Abstract :
We report the systematic study and design optimization of CMOS-compatible on-chip ferrite-integrated inductors, including detailed quantitative analysis by simulation and circuit modeling, new ferrite fabrication and characterization, ferrite-integrated-inductor design, measurement, and optimization. A new ferrite nanopowder-mixed-photoresist spin-coating/inkjetting technique is discussed. The design and characterization of ferrite-integrated inductors with various ferrite-filling structures are presented. Measurement shows substantial improvement of up to +160% in inductance (L) and + 220% in quality factor (Q) across the multigigahertz frequency spectrum with a self-resonance frequency (f 0) over 20 GHz for the new ferrite-integrated inductors. This study clearly suggests that the new ferrite-integrated inductor technique is a potential solution to the realization of radio-frequency systems-on-a-chip requiring high-performance compact on-chip inductors. This work is presented in two parts. Part I discusses the design and simulation of ferrite-integrated inductors. This paper is Part II, presenting experimental results for material research and device implementation.
Keywords :
CMOS digital integrated circuits; nanoparticles; radiofrequency integrated circuits; system-on-chip; CMOS-compatible on-chip ferrite-integrated inductors; RF IC; ferrite nanopowder-mixed-photoresist spin-coating; ferrite-fllling structures; frequency 20 GHz; inkjetting technique; quality factor; radio-frequency systems-on-a-chip; Analytical models; Circuit simulation; Design optimization; Fabrication; Ferrites; Inductance measurement; Inductors; Q measurement; Radio frequency; System-on-a-chip; Inductor; radio frequency (RF); soft ferrite;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2009.2033413