DocumentCode :
1532808
Title :
Bandgap-Engineered Ga-Rich GaZnO Thin Films for UV Transparent Electronics
Author :
Zhao, Junliang ; Sun, Xiao Wei ; Tan, Swee Tiam
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
Volume :
56
Issue :
12
fYear :
2009
Firstpage :
2995
Lastpage :
2999
Abstract :
Ga-rich GaZnO thin films were prepared by metal-organic chemical vapor deposition. The optical bandgap of GaZnO films can be engineered from 3.3 to 4.9 eV by varying the Ga content. The film is amorphortized and the resistivity increases with an increase of Ga content. The Ga-rich GaZnO alloy with lower resistivity is investigated as a UV transparent conductor, while the semi-insulating Ga-rich GaZnO film with high transparency at 280-900 nm is employed as the channel layer to fabricate deep UV transparent thin-film transistor. The transistor shows a typical n-channel field-effect characteristic with a current on/off ratio of 104 - 105, a threshold voltage of ~42 V, a saturated field-effect mobility of ~0.06 cm2 middot V-1 middot s-1, and a subthreshold swing of ~7.7 V middot decade-1.
Keywords :
II-VI semiconductors; MOCVD; amorphous semiconductors; electrical resistivity; energy gap; field effect transistors; gallium compounds; semiconductor growth; semiconductor thin films; thin film transistors; transparency; wide band gap semiconductors; zinc compounds; GaZnO; UV transparent electronics; UV transparent thin-film transistor; amorphortized film; bandgap-engineered thin films; gallium-rich thin films; metal-organic chemical vapor deposition; n-channel field-effect characteristic; optical bandgap; resistivity; saturated field-effect mobility; wavelength 280 nm to 900 nm; Chemical vapor deposition; Conductive films; Conductivity; FETs; Optical films; Optical saturation; Photonic band gap; Sputtering; Thin film transistors; Threshold voltage; Bandgap engineering; GaZnO; UV transparent electronics;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2009.2033010
Filename :
5306170
Link To Document :
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