Title :
Linearity and temperature dependence of large-area processed high-q barium strontium titanate thin-film varactors [Correspondence]
Author :
Subramanyam, Guru ; Patterson, Maxx ; Leedy, Kevin ; Neidhard, R. ; Varanasi, Chakrapani ; Chenhao Zhang ; Steinhauer, Gregg
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Dayton, Dayton, OH, USA
fDate :
7/1/2010 12:00:00 AM
Abstract :
Ba0.6Sr0.4TiO3 (BST) thin-films with large dielectric tunability as high as 4:1 were obtained using a large-area pulsed laser deposition process, with low loss-tangents below 0.01 at zero-bias and 10 GHz. This paper summarizes experimental results obtained on large-area processed BST thin films on 100-mm-diameter sapphire substrates characterized using a varactor shunt switch test structure. Varactors with 0.25-μm-thick BST films exhibited large dielectric tunability, the relative dielectric permittivity at zero bias of 990 tuned to 250 at an electric field of 320 kV/cm. The leakage current through the BST film was below 2 nA up to 6 V dc bias. The quality factor (Q) exceeded 300 at relatively low 6 V dc bias for the BST varactors at 1 GHz. These results confirm that large-area processed BST thin films are ready to compete with semiconductor varactors for commercial applications at RF, microwave, and millimeterwave frequencies.
Keywords :
barium compounds; dielectric losses; leakage currents; permittivity; pulsed laser deposition; strontium compounds; thin film capacitors; varactors; Al2O3; BST thin-films; BST varactors; Ba0.6Sr0.4TiO3; dielectric tunability; frequency 1 GHz; frequency 10 GHz; high-Q barium strontium titanate thin-film varactors; leakage current; loss-tangents; pulsed laser deposition process; relative dielectric permittivity; sapphire substrates; semiconductor varactors; size 0.25 mum; size 100 mm; varactor shunt switch test structure; zero-bias; Barium; Binary search trees; Dielectric substrates; Dielectric thin films; Linearity; Strontium; Temperature dependence; Titanium compounds; Transistors; Varactors;
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
DOI :
10.1109/TUFFC.2010.1599