• DocumentCode
    1532899
  • Title

    Microwave Multipactor Breakdown Between Two Cylinders

  • Author

    Rasch, J. ; Anderson, D. ; Johansson, Joakim F. ; Lisak, M. ; Puech, J. ; Rakova, Elena ; Semenov, V.E.

  • Author_Institution
    Chalmers Univ. of Technol., Goteborg, Sweden
  • Volume
    38
  • Issue
    8
  • fYear
    2010
  • Firstpage
    1997
  • Lastpage
    2005
  • Abstract
    An analysis has been made of the microwave breakdown threshold for multipactor in an open structure comprising two parallel cylinders, approximating, e.g., parts of a helix antenna. The electron motion in the corresponding electromagnetic field is analyzed by separating the motion into a slowly varying drift velocity (driven by the ponderomotive force due to the electric field inhomogeneity) and a rapidly oscillating part (driven by the oscillating electric field). Furthermore, the curvature of the cylindrical surfaces of emission is shown to give rise to a new effect that implies a loss of electrons. This leads to a more stringent multipactor breakdown condition for the two-wire structure than for the classical situation corresponding to the case of two plane parallel infinite plates. The importance of this effect is determined by the ratio of the cylinder radii and the distance between the cylinders, and it is shown that when this ratio is small, multipactor can only occur for surfaces having very large secondary emission coefficients. A detailed analysis is also made to determine the lowest voltage between the cylinders at which multipactor becomes possible.
  • Keywords
    electric breakdown; microwave switches; cylinder radii ratio; drift velocity; electromagnetic field; electron loss; electron motion; helix antenna; microwave multipactor breakdown threshold; parallel cylinders; secondary emission coefficients; two plane parallel infinite plates; two-wire structure; Helix antenna; microwave breakdown; multipactor;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2010.2052372
  • Filename
    5508301