Title :
Macromodeling of single-electron transistors for efficient circuit simulation
Author :
Yu, Yun Seop ; Hwang, Sung Woo ; Ahn, Doyeol
Author_Institution :
Dept. of Electron. Eng., Korea Univ., Seoul, South Korea
fDate :
8/1/1999 12:00:00 AM
Abstract :
In this study, the possibility of compact modeling in single-electron circuit simulation has been investigated. It is found that each Coulomb island in single-electron circuits can be treated independently when the interconnections between single-electron transistors are large enough and a quantitative criterion for this condition is given. It is also demonstrated that, in those situations, SPICE macromodeling of single-electron transistors can be used for efficient circuit simulation. The developed macromodel produces simulation results with reasonable accuracy and with orders of magnitude less CPU time than usual Monte Carlo simulations
Keywords :
SPICE; circuit simulation; semiconductor device models; single electron transistors; Coulomb island; SPICE macromodel; compact model; single electron circuit simulation; single electron transistor; Central Processing Unit; Circuit simulation; Information processing; Integrated circuit interconnections; Inverters; Logic circuits; SPICE; Silicon; Single electron transistors; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on