DocumentCode
1532906
Title
Macromodeling of single-electron transistors for efficient circuit simulation
Author
Yu, Yun Seop ; Hwang, Sung Woo ; Ahn, Doyeol
Author_Institution
Dept. of Electron. Eng., Korea Univ., Seoul, South Korea
Volume
46
Issue
8
fYear
1999
fDate
8/1/1999 12:00:00 AM
Firstpage
1667
Lastpage
1671
Abstract
In this study, the possibility of compact modeling in single-electron circuit simulation has been investigated. It is found that each Coulomb island in single-electron circuits can be treated independently when the interconnections between single-electron transistors are large enough and a quantitative criterion for this condition is given. It is also demonstrated that, in those situations, SPICE macromodeling of single-electron transistors can be used for efficient circuit simulation. The developed macromodel produces simulation results with reasonable accuracy and with orders of magnitude less CPU time than usual Monte Carlo simulations
Keywords
SPICE; circuit simulation; semiconductor device models; single electron transistors; Coulomb island; SPICE macromodel; compact model; single electron circuit simulation; single electron transistor; Central Processing Unit; Circuit simulation; Information processing; Integrated circuit interconnections; Inverters; Logic circuits; SPICE; Silicon; Single electron transistors; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.777155
Filename
777155
Link To Document