• DocumentCode
    1532906
  • Title

    Macromodeling of single-electron transistors for efficient circuit simulation

  • Author

    Yu, Yun Seop ; Hwang, Sung Woo ; Ahn, Doyeol

  • Author_Institution
    Dept. of Electron. Eng., Korea Univ., Seoul, South Korea
  • Volume
    46
  • Issue
    8
  • fYear
    1999
  • fDate
    8/1/1999 12:00:00 AM
  • Firstpage
    1667
  • Lastpage
    1671
  • Abstract
    In this study, the possibility of compact modeling in single-electron circuit simulation has been investigated. It is found that each Coulomb island in single-electron circuits can be treated independently when the interconnections between single-electron transistors are large enough and a quantitative criterion for this condition is given. It is also demonstrated that, in those situations, SPICE macromodeling of single-electron transistors can be used for efficient circuit simulation. The developed macromodel produces simulation results with reasonable accuracy and with orders of magnitude less CPU time than usual Monte Carlo simulations
  • Keywords
    SPICE; circuit simulation; semiconductor device models; single electron transistors; Coulomb island; SPICE macromodel; compact model; single electron circuit simulation; single electron transistor; Central Processing Unit; Circuit simulation; Information processing; Integrated circuit interconnections; Inverters; Logic circuits; SPICE; Silicon; Single electron transistors; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.777155
  • Filename
    777155