Rapid computer-controlled capacitance transient characterization of deep-level centers

A computer-based deep-level capacitance transient spectrometer is described which was designed and constructed as a result of the inadequacy which was designed and constructed as a result of the inadequacy of commercially available deep-level transient spectrometers. Deep-level activation energies and trap concentrations are obtained in a single-temperature scan. Unlike conventional systems, which `contour´ predetermined emission rates by viewing a rate window, giving only one point per level, thermal emission rates are directly determined. This retains more information and reduces the redundancy of conventional methods by obtaining all information necessary to construct an Arrhenius plot in a single-temperature ramp. The method requires fewer computer calculations compared with systems using fast Fourier analysis, and displays improved signal-to-noise ratios. Data is displayed in the form of an Arrhenius plot for level depth and capture cross section assessment, and a ΔC versus temperature graph provides information on trap concentrations.