• DocumentCode
    1533148
  • Title

    Thermionic Field Emission Explanation for Nonlinear Richardson Plots

  • Author

    Kenney, Crystal ; Saraswat, Krishna C. ; Taylor, Bill ; Majhi, Prashant

  • Author_Institution
    Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA
  • Volume
    58
  • Issue
    8
  • fYear
    2011
  • Firstpage
    2423
  • Lastpage
    2429
  • Abstract
    Accurate extraction of the Schottky barrier height (SBH) is imperative to the development of low-resistance contacts. Nonlinearity in the Richardson plot generates errors in the extraction of the SBH. Without invoking generation-recombination currents, defect-assisted tunneling, or even inhomogeneity, nonlinearity of the Richardson plot can be explained by thermionic field emission (TFE) and can be evidenced even in lightly doped diodes. An analytical model is proposed whereby the extracted barrier height is actually related to the peak energy of the energy distribution of the emitted electrons and can be extracted from a typical Richardson plot using polynomial regression. A comparison of the proposed model with the conventional model and a popular inhomogeneous model that uses a Gaussian distribution of barrier heights concludes that the proposed TFE model extends the doping range of an accurate extraction of the SBH.
  • Keywords
    Gaussian distribution; Schottky barriers; Schottky diodes; polynomials; regression analysis; semiconductor doping; thermionic emission; Gaussian distribution; Schottky barrier height; doped diodes; low-resistance contacts; nonlinear Richardson plots; polynomial regression; thermionic field emission explanation; Doping; Junctions; Metals; Nonhomogeneous media; Schottky barriers; Semiconductor process modeling; Temperature measurement; Arrhenius plot; Richardson plot; Schottky barrier height (SBH); diode; simulation; theory; thermionic field emission (TFE);
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2011.2156411
  • Filename
    5783904