• DocumentCode
    1533149
  • Title

    Ultrawide Bandwidth RFID: The Next Generation?

  • Author

    Dardari, Davide ; Errico, Raffaele D. ; Roblin, Christophe ; Sibille, Alain ; Win, Moe Z.

  • Author_Institution
    Dipt. di Elettron., Inf. e Sist. (DEIS), Univ. of Bologna at Cesena, Cesena, Italy
  • Volume
    98
  • Issue
    9
  • fYear
    2010
  • Firstpage
    1570
  • Lastpage
    1582
  • Abstract
    Future advanced radio-frequency identification (RFID) systems are expected to provide both identification and high-definition localization of objects with improved reliability and security while maintaining low power consumption and cost. Ultrawide bandwidth (UWB) technology is a promising solution for next generation RFID systems to overcome most of the limitations of the current narrow bandwidth RFID technology such as: reduced area coverage, insufficient ranging resolution for accurate localization, sensitivity to interference, and scarce multiple-access capability. In this paper, a survey of current progress in the application of the UWB technology for RFID systems is presented with particular attention to low-complexity solutions for high-definition tag localization.
  • Keywords
    radiofrequency identification; radiofrequency interference; telecommunication network reliability; telecommunication security; ultra wideband communication; UWB technology; area coverage; high-definition tag localization; interference; low power consumption; multiple-access capability; next generation RFID system; object identification; radio-frequency identification system; reliability; security; ultrawide bandwidth RFID; Bandwidth; Costs; Energy consumption; Maintenance; Multiple access interference; Power system reliability; Power system security; Radio frequency; Radiofrequency identification; Ultra wideband technology; Backscatter modulation; localization; radio-frequency identification (RFID); ultrawide bandwidth (UWB);
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/JPROC.2010.2053015
  • Filename
    5508335