• DocumentCode
    1533169
  • Title

    Noniterative Compact Modeling for Intrinsic Carbon-Nanotube FETs: Quantum Capacitance and Ballistic Transport

  • Author

    Wei, Lan ; Frank, David J. ; Chang, Leland ; Wong, H. -S Philip

  • Author_Institution
    Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA
  • Volume
    58
  • Issue
    8
  • fYear
    2011
  • Firstpage
    2456
  • Lastpage
    2465
  • Abstract
    In this paper, an analytical model of intrinsic carbon-nanotube field-effect transistors is presented. The origins of the channel carriers are analyzed in the ballistic limit. A noniterative surface-potential model is developed based on an analytical electrostatic model and a piecewise constant quantum-capacitance model. The model is computationally efficient with no iteration or numerical integration involved, thus facilitating fast circuit simulation and system optimization. Essential physics such as drain-induced barrier lowering and quantum capacitance are captured with reasonable accuracy.
  • Keywords
    ballistic transport; capacitance; carbon nanotubes; field effect transistors; nanotube devices; semiconductor device models; C; analytical electrostatic model; ballistic limit; ballistic transport; drain-induced barrier; fast circuit simulation; intrinsic carbon nanotube FET; intrinsic carbon nanotube field effect transistors; noniterative compact modeling; noniterative surface-potential model; numerical integration; piecewise constant quantum-capacitance model; quantum capacitance; system optimization; Analytical models; CNTFETs; Electric potential; Electrostatics; Logic gates; Quantum capacitance; Analytical model; ballistic transport; carbon nanotube (CNT); carbon-nanotube field-effect transistor (CNTFET); compact model; quantum capacitance;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2011.2153858
  • Filename
    5783907