Optical effects at projection measurements for Terahertz tomography

Author

Brahm, A. ; Merx, S. ; Tymoshchuk, M. ; Notni, G. ; Tunnermann, Andreas

Author_Institution

Fraunhofer Inst. for Appl. Opt. & Precision Eng. (IOF), Jena, Germany

fYear

2014

fDate

14-19 Sept. 2014

Firstpage

1

Lastpage

2

Abstract

Optical aberrations like refraction, diffraction and edge effects have an influence on Terahertz measurements. They can produce image artifacts which make it difficult to detect and resolve material defects inside the samples. We used a geometrical optical ray tracing approach to analyze the optical effects at Terahertz projection measurements which can be used to perform 2D or 3D THz images. We measured plastic samples with different shapes and compared them to simulations which are realized with the software ZEMAX. Furthermore, different methods to overcome the impact of edge effects will be introduced.

Keywords

aberrations; light diffraction; light refraction; optical tomography; optical variables measurement; ray tracing; terahertz wave imaging; 2D THz images; 3D THz images; ZEMAX software; diffraction effects; edge effects; geometrical optical ray tracing approach; image artifacts; material defects; optical aberrations; optical effects; plastic samples; refraction effects; terahertz measurements; terahertz projection measurements; terahertz tomography; Adaptive optics; Optical diffraction; Optical distortion; Optical imaging; Optical refraction; Optical variables control; Optical variables measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Infrared, Millimeter, and Terahertz waves (IRMMW-THz), 2014 39th International Conference on

Conference_Location

Tucson, AZ

Type

conf

DOI

10.1109/IRMMW-THz.2014.6956377

Filename

6956377