Title :
Semiconductor laser linewidth from the transmission-line laser model
Author :
Chan, Y.C. ; Premaratne, M. ; Lowery, A.J.
Author_Institution :
Dept. of Electr. & Electron. Eng., Melbourne Univ., Parkville, Vic., Australia
fDate :
8/1/1997 12:00:00 AM
Abstract :
Two methods for determining semiconductor laser linewidth using the transmission-line laser model (TLLM) are developed. The first is a semianalytical method suitable for DFB lasers. The second uses Fourier transforms to extract the laser spectrum from the simulated optical field, and is suitable for any laser structure. A technique for increasing the accuracy of this second method has been developed. Extensive comparisons with previous work verify the accuracy of both methods
Keywords :
Fourier transform optics; distributed feedback lasers; laser theory; semiconductor device models; semiconductor lasers; spectral line breadth; transmission line theory; DFB lasers; Fourier transforms; accuracy; laser spectrum; laser structure; semianalytical method; semiconductor laser linewidth; simulated optical field; transmission-line laser model;
Journal_Title :
Optoelectronics, IEE Proceedings -
DOI :
10.1049/ip-opt:19970915
