• DocumentCode
    1533528
  • Title

    Experimental investigation of acoustic substrate losses in 1850-MHz thin film BAW resonators

  • Author

    Pensala, Tuomas ; Thalhammer, Robert ; Dekker, James ; Kaitila, Jyrki

  • Author_Institution
    VTT Tech. Res. Centre of Finland, Espoo, Finland
  • Volume
    56
  • Issue
    11
  • fYear
    2009
  • fDate
    11/1/2009 12:00:00 AM
  • Firstpage
    2544
  • Lastpage
    2552
  • Abstract
    After optimizing for electromechanical coupling coefficient K2, the main performance improvement in the thin film bulk acoustic wave resonators and filters can be achieved by improving the Q value, i.e., minimizing the losses. In Bragg-reflector-based solidly mounted resonator technology, a significant improvement of Q has been achieved by optimizing the reflector not only for longitudinal wave, the intended operation mode, but also for shear waves. We have investigated the remaining acoustic radiation losses to the substrate in so-optimized 1850-MHz AlN resonators by removing the substrate underneath the resonators and comparing the devices with and without substrate by electrical characterization before and after the substrate removal. Several methods to extract Q-values of the resonators are compared. Changes caused by substrate removal are observed in resonator behavior, but no significant improvement in Q-values can be confirmed. Loss mechanisms other than substrate leakage are concluded to dominate the resonator Q-value. Difficulties of detecting small changes in the Q-values of the resonators are also discussed.
  • Keywords
    III-V semiconductors; Q-factor; acoustic resonator filters; aluminium compounds; bulk acoustic wave devices; electromechanical filters; losses; piezoelectric thin films; thin film devices; wide band gap semiconductors; AlN; Bragg reflector; Q value; acoustic radiation losses; acoustic substrate losses; bulk acoustic wave filters; electrical characterization; electromechanical coupling coefficient; frequency 1850 MHz; shear waves; solidly mounted resonator technology; thin film BAW resonators; Data mining; Electrical resistance measurement; Frequency measurement; Impedance measurement; Noise measurement; Q measurement; RLC circuits; Resonance; Substrates; Transistors; Acoustics; Computer-Aided Design; Energy Transfer; Equipment Design; Equipment Failure Analysis; Membranes, Artificial; Reproducibility of Results; Sensitivity and Specificity; Transducers;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/TUFFC.2009.1341
  • Filename
    5306734