DocumentCode :
1533755
Title :
Interaction of a monochromatic ultrasonic beam with a finite length defect at the interface between two anisotropic layers: kirchhoff approximation and fourier representation
Author :
Vacossin, Bruno ; Potel, Catherine ; Gatignol, Philippe ; De Belleval, Jean-François
Author_Institution :
Lab. Roberval, Univ. de Technol. de Compiegne, Compiegne, France
Volume :
56
Issue :
10
fYear :
2009
fDate :
10/1/2009 12:00:00 AM
Firstpage :
2251
Lastpage :
2267
Abstract :
This paper presents a fast computation method to simulate the interaction between a bounded acoustic beam and a 2-layered anisotropic structure with a finite defect on the internal interface. The method uses the classical Fourier decomposition of the fields into plane waves, and the Kirchhoff approximation is introduced to calculate the diffusion by the defect. The validity of the approximation is estimated by comparison with the Keller Geometrical Theory of Diffraction and with results obtained by boundary element methods. The quickness of the method allows testing several geometrical configurations (varying incident angle, thickness of the layers or the physical nature of the defect). These studies may be used to foresee what experimental configurations would be adequate to have a chance to detect the defect.
Keywords :
Fourier analysis; anisotropic media; crystal defects; diffusion; interface phenomena; ultrasonic applications; ultrasonic effects; Fourier decomposition; Keller Geometrical Theory of Diffraction; Kirchhoff approximation; anisotropic layer interface; boundary element method; diffusion; finite length defect; monochromatic ultrasonic beam; Acoustic beams; Anisotropic magnetoresistance; Boundary element methods; Computational modeling; Computer interfaces; Kirchhoff´s Law; Physical theory of diffraction; Testing;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/TUFFC.2009.1307
Filename :
5306771
Link To Document :
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