• DocumentCode
    1533755
  • Title

    Interaction of a monochromatic ultrasonic beam with a finite length defect at the interface between two anisotropic layers: kirchhoff approximation and fourier representation

  • Author

    Vacossin, Bruno ; Potel, Catherine ; Gatignol, Philippe ; De Belleval, Jean-François

  • Author_Institution
    Lab. Roberval, Univ. de Technol. de Compiegne, Compiegne, France
  • Volume
    56
  • Issue
    10
  • fYear
    2009
  • fDate
    10/1/2009 12:00:00 AM
  • Firstpage
    2251
  • Lastpage
    2267
  • Abstract
    This paper presents a fast computation method to simulate the interaction between a bounded acoustic beam and a 2-layered anisotropic structure with a finite defect on the internal interface. The method uses the classical Fourier decomposition of the fields into plane waves, and the Kirchhoff approximation is introduced to calculate the diffusion by the defect. The validity of the approximation is estimated by comparison with the Keller Geometrical Theory of Diffraction and with results obtained by boundary element methods. The quickness of the method allows testing several geometrical configurations (varying incident angle, thickness of the layers or the physical nature of the defect). These studies may be used to foresee what experimental configurations would be adequate to have a chance to detect the defect.
  • Keywords
    Fourier analysis; anisotropic media; crystal defects; diffusion; interface phenomena; ultrasonic applications; ultrasonic effects; Fourier decomposition; Keller Geometrical Theory of Diffraction; Kirchhoff approximation; anisotropic layer interface; boundary element method; diffusion; finite length defect; monochromatic ultrasonic beam; Acoustic beams; Anisotropic magnetoresistance; Boundary element methods; Computational modeling; Computer interfaces; Kirchhoff´s Law; Physical theory of diffraction; Testing;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/TUFFC.2009.1307
  • Filename
    5306771