• DocumentCode
    1533849
  • Title

    Latchup Topology for Pixel Readout Using Commercial Transistors

  • Author

    Gabrielli, Alessandro

  • Author_Institution
    INFN-Bologna, Bologna, Italy
  • Volume
    57
  • Issue
    4
  • fYear
    2010
  • Firstpage
    2167
  • Lastpage
    2172
  • Abstract
    The stimulated ignition of latchup effects caused by external radiation has till now proved to be a hidden hazard. However this paper presents the effect in a new light-as a new approach for detecting particles by means of a solid-state device susceptible to latchup effects. This device can also be used as a circuit for reading a sensor´s signal by leaving off-circuit sensing capabilities. Given that MOS transistors are widely used in microelectronics devices and sensors, the latchup-based cell is proposed as a new structure for future applications in particle detection, in the amplification of sensor signals and also in radiation monitoring.
  • Keywords
    CMOS integrated circuits; radiation detection; radiation monitoring; readout electronics; thyristors; MOS transistors; commercial transistors; external radiation; latchup topology; latchup-based cell; microelectronics devices; off-circuit sensing capabilities; particle detection; pixel readout; radiation monitoring; sensor signal; solid-state device; CMOSFET circuits; radiation detectors; radiation effects; thyristors;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2010.2051560
  • Filename
    5508439