• DocumentCode
    1533860
  • Title

    Dynamic bottleneck control in wide variety production factory

  • Author

    Nakata, Tomohito ; Matsui, Koichi ; Miyake, Yasuhisa ; Nishioka, Kyusaku

  • Author_Institution
    Manuf. Eng. Center, Mitsubishi Electr. Corp., Hyogo, Japan
  • Volume
    12
  • Issue
    3
  • fYear
    1999
  • fDate
    8/1/1999 12:00:00 AM
  • Firstpage
    273
  • Lastpage
    280
  • Abstract
    At a factory which produces a wide variety of products such as ASIC´s or microcomputers, it is necessary to detect any machine causing a bottleneck and return it to a high level of performance for fast and effective production. This paper introduces a workflow control system called “JUSTICE/MORAL” (just time process control system/method of optimum-buffer restriction and adjustment logic) which dynamically detects a machine causing a bottleneck and feeds work to that machine at an appropriate time. The advantages of this system are as follows: (1) manufacturing cycle time can be reduced by an average of 13% and a maximum of 50% and (2) throughput can be increased up to approximately 10%. Part of this system has been installed in our factory. We have seen factory cycle time improve by approximately 20% in the two month period from July to September 1998. Also, the machine causing the bottleneck was found quickly; as a result, the utilization of this machine increased by 3%,
  • Keywords
    computer aided production planning; graphical user interfaces; industrial control; integrated circuit manufacture; manufacturing data processing; production control; real-time systems; JUSTICE/MORAL; adjustment logic; dynamic bottleneck control; just time process control system; manufacturing cycle time reduction; optimum-buffer restriction; semiconductor manufacturing; throughput improvement; wide variety production factory; workflow control system; Control systems; Fabrication; Logic; Manufacturing processes; Microcomputers; Process control; Production facilities; Production planning; Semiconductor device manufacture; Throughput;
  • fLanguage
    English
  • Journal_Title
    Semiconductor Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/66.778190
  • Filename
    778190